Electromagnetic compatibility (EMC) - Electromagnetic compatibility of and in systems - Part 10: Test procedure for conducted emissions (current); Amendment A1; Text in German and English
Edition 2020-02

Electromagnetic compatibility (EMC) - Electromagnetic compatibility of and in systems - Part 10: Test procedure for conducted emissions (current); Text in German and English
Edition 2019-02

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition 2010-05

Tabular layouts of article characteristics for transistors and thyristors
Edition 1988-12

Methods of measurement for equipment used in digital microwave transmission systems - Part 3: Measurements on satellite earth stations; section 6: High-power amplifiers (IEC 60835-3-6:1996); German version EN 60835-3-6:1996
Edition 1997-03

Vacuum technology - Acceptance specifications for ion getter pumps
Edition 2014-05

Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2016); German version EN 62047-1:2016
Edition 2016-12

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010
Edition 2011-03

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
Edition 2005-03

Non-destructive testing - Thermographic testing - Eddy-current excited thermography
Edition 2018-02