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BS EN 60444-1
Measurement of quartz crystal unit parameters. Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a $Gp-network
Edition
1993-09-15
ISO 16063-32
Methods for the calibration of vibration and shock transducers - Part 32: Resonance testing - Testing the frequency and the phase response of accelerometers by means of shock excitation
Edition
2016-09
DIN EN 60444-4
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz (IEC 60444-4:1988); German version EN 60444-4:1997
Edition
1997-10
DIN EN 60444-11
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (IEC 60444-11:2010); German version EN 60444-11:2010
Edition
2011-06
DIN EN 60444-9
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
Edition
2007-12
DIN EN 62674-1
High frequency inductive components - Part 1: Fixed surface mount inductors for use in electronic and telecommunication equipment (IEC 62674-1:2012); German version EN 62674-1:2012
Edition
2013-06
DIN EN IEC 62024-1
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor (IEC 62024-1:2017); German version EN IEC 62024-1:2018
Edition
2019-02
DIN ISO 3312
Sintered metal materials and hardmetals; determination of young modulus; identical with ISO 3312:1987
Edition
1990-10
DIN EN 60444-3
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance Cₒ (IEC 60444-3:1986); German version EN 60444-3:1997
Edition
1997-10
DIN EN 60444-8
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017
Edition
2017-11