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Standards [CURRENT]

UNE-EN IEC 60512-8-3

Connectors for electrical and electronic equipment - Tests and measurements - Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever (Endorsed by Asociación Española de Normalización in May of 2018.)
Edition 2018-05-01

Standards [CURRENT]

UNE-EN 2591-427

Aerospace series - Elements of electrical and optical connection - Test methods - Part 427: Robustness of protective cover attachment. (Endorsed by AENOR in April of 2002.)
Edition 2002-04-01

Standards [CURRENT]

UNE-EN 60068-2-21

Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices (IEC 60068-2-21:2006)
Edition 2007-02-07

Standards [CURRENT]

UNE-EN 60512-15-7

Connectors for electronic equipment - Tests and measurements - Part 15-7: Connector tests (mechanical) - Test 15g: Robustness of protective cover attachment (Endorsed by AENOR in December of 2008.)
Edition 2008-12-01

Standards [CURRENT]

UNE-EN 60512-16-6

Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations (Endorsed by AENOR in February of 2009.)
Edition 2009-02-01

Standards [CURRENT]

UNE-EN 60512-17-1

Connectors for electronic equipment - Tests and measurements - Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness (Endorsed by AENOR in November of 2010.)
Edition 2010-11-01

Standards [CURRENT]

UNE-EN 60749-14

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Edition 2004-06-11

Standards [CURRENT]

EIA-186-6E

Passive Electronic Component Parts, Test Methods for; Method 6: Mechanical Robustness of Terminals
Edition 1978-10

Technical rule [CURRENT]

EIA JEP 186

Guideline to Specify a Transient Off-State Withstand Voltage Robustness Indicator in Datasheets for Lateral GaN Power Conversion Devices, Version 1.0
Edition 2021-12

Technical rule [CURRENT]

EIA JEP 194

Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs
Edition 2023-02

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