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EIA JESD 435
Standard for the Measurement of Small-Signal Transistor Scattering Parameters
Edition
1976-04
DIN EN 120003
Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
Edition
1996-11
DIN 4000-19
Tabular layouts of article characteristics for transistors and thyristors
Edition
1988-12
DIN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
Edition
2010-12
DIN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
Edition
2010-12
DIN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
Edition
2007-01
BS IEC 62860-1
Test methods for the characterization of organic transistor-based ring oscillators
Edition
2014-08-31
DIN EN 120004
Blank detail specification: Ambient rated photocouplers with phototransistor output; German version EN 120004:1992
Edition
1997-02
IEEE 62860-1
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
Edition
2013
BS QC 750106
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
Edition
1993-07-15