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Standards [CURRENT]

EIA JESD 435

Standard for the Measurement of Small-Signal Transistor Scattering Parameters
Edition 1976-04

Standards [CURRENT]

DIN EN 120003

Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
Edition 1996-11

Standards [CURRENT]

DIN 4000-19

Tabular layouts of article characteristics for transistors and thyristors
Edition 1988-12

Standards [CURRENT]

DIN EN 62417

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
Edition 2010-12

Standards [CURRENT]

DIN EN 62416

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
Edition 2010-12

Standards [CURRENT]

DIN EN 62373

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
Edition 2007-01

Standards [CURRENT]

BS IEC 62860-1

Test methods for the characterization of organic transistor-based ring oscillators
Edition 2014-08-31

Standards [CURRENT]

DIN EN 120004

Blank detail specification: Ambient rated photocouplers with phototransistor output; German version EN 120004:1992
Edition 1997-02

Standards [CURRENT]

IEEE 62860-1

IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
Edition 2013

Standards [CURRENT]

BS QC 750106

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
Edition 1993-07-15

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