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BS ISO 17560
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Edition
2014-09-30
BS ISO 14606
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Edition
2023-02-15
PD IEC/TR 62361-103
Power systems management and associated information exchange. Interoperability in the long term. Standard profiling
Edition
2018-04-26
BS ISO 11505
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Edition
2013-01-31
PD ISO/TR 18161
Automation systems and integration. Applications integration approach using information exchange requirements modelling and software capability profiling
Edition
2013-07-31
ABNT ISO/TR 17119
Health informatics - Helath informatics profiling framework
Edition
2008-08-18
ISO/TS 8000-81
Data quality - Part 81: Data quality assessment: Profiling
Edition
2021-05
UNE-EN ISO 19085-12
Woodworking machines - Safety - Part 12: Tenoning/profiling machines (ISO 19085-12:2021)
Edition
2021-10-13
UNE-EN ISO 19085-12/A11
Woodworking machines - Safety - Part 12: Tenoning/profiling machines (ISO 19085-12:2021)
Edition
2023-06-21
BS ISO 17109
Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films
Edition
2022-04-13