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Standards [CURRENT]

BS ISO 17560

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Edition 2014-09-30

Standards [CURRENT]

BS ISO 14606

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Edition 2023-02-15

Standards [CURRENT]

PD IEC/TR 62361-103

Power systems management and associated information exchange. Interoperability in the long term. Standard profiling
Edition 2018-04-26

Standards [CURRENT]

BS ISO 11505

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Edition 2013-01-31

Standards [CURRENT]

PD ISO/TR 18161

Automation systems and integration. Applications integration approach using information exchange requirements modelling and software capability profiling
Edition 2013-07-31

Standards [CURRENT]

ABNT ISO/TR 17119

Health informatics - Helath informatics profiling framework
Edition 2008-08-18

Pre-standard

ISO/TS 8000-81

Data quality - Part 81: Data quality assessment: Profiling
Edition 2021-05

Standards [CURRENT]

UNE-EN ISO 19085-12

Woodworking machines - Safety - Part 12: Tenoning/profiling machines (ISO 19085-12:2021)
Edition 2021-10-13

Standards [CURRENT]

UNE-EN ISO 19085-12/A11

Woodworking machines - Safety - Part 12: Tenoning/profiling machines (ISO 19085-12:2021)
Edition 2023-06-21

Standards [CURRENT]

BS ISO 17109

Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films
Edition 2022-04-13

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