Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/803/CDV) (english version)
Edition 2023-04-15

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2823/CDV) (english version)
Edition 2024-02-01

Low-voltage switchgear and controlgear - Part 4-3: Contactors and motor-starters - Semiconductor controllers and semiconductor contactors for non-motor loads (IEC 121A/307/CDV) (english version)
Edition 2019-09-01

Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices (IEC 47F/320/CDV) (english version)
Edition 2019-02-01

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability (IEC 47/2679/CDV) (english version)
Edition 2021-04-01

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation (IEC 47/2680/CDV) (english version)
Edition 2021-04-01

Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors (IEC 47/2681/CDV) (english version)
Edition 2021-04-01

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV) (english version)
Edition 2021-11-01

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV) (english version)
Edition 2022-02-15

Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices (IEC 47F/242/CDV) (english version)
Edition 2016-06-15