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EIA JEP 156A
Chip-Package Interaction Understanding, Identification, and Evaluation
Edition
2018-03
EIA JEP 158
3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions
Edition
2009-11
EIA JEP 174
Understanding Electrical Overstress - EOS
Edition
2016-09
IEEE 1695
IEEE Guide to Understanding, Diagnosing, and Mitigating Stray and Contact Voltage
Edition
2016
IEEE 3303
IEEE Standard Adoption of Moving Picture, Audio and Data Coding by Artificial Intelligence (MPAI) Technical Specification Compression and Understanding of Industrial Data 1.1
Edition
2023
NEMA BS 31046
Guide to Understanding Smoke Control Systems
Edition
2023
NEMA ICS 2.4
NEMA and IEC Devices for Motor Service - A Guide for Understanding the Differences
Edition
2020
NEMA LS 20004
Understanding the Fluorescent Ballast Rule EPCA 10 CFR 430
Edition
2017
NEMA MITA DD P 1
Understanding the Limited Usefulness of Detector Dose Measurements in Modern Medical X-ray Imaging Equipment
Edition
2019
NEMA MITA SAC 1
Understanding Accountability in Medical Device Servicing
Edition
2020
