Measurement of the Electrical Properties of Microwave Tubes; Part 3: Disk Seal Tubes
Edition 1978-04

Design automation - Part 1: Standard test language for all systems - Common abbreviated test language for all systems (C/ATLAS) (IEC 61926-1:1999); German version EN 61926-1:2000
Edition 2000-11

Piezoelectric ceramic resonators; part 3: standard outlines; identical with IEC 60642-3:1992
Edition 1993-09

Rectangular connectors for frequencies below 3 MHz; part 1: generic specification; general requirements; identical with IEC 60807-1:1991
Edition 1993-04

Surface acoustic wave (SAW) resonators; part 3: standard outlines and lead connections; identical with IEC 61019-3:1991
Edition 1993-09

Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; identical with IEC 60122-2:1983
Edition 1993-09

A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 3: Sectional specification, qualification approval; section 1: Blank detail specification; identical with IEC 61178-3-1:1993
Edition 1995-02

Piezoelectric filters; part 2: guide to the use of piezoelectric filters; section 1: quartz crystal filters; identical with IEC 60368-2-1:1988
Edition 1993-07

A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 2: Sectional specification, capability approval; section 1: Blank detail specification; identical with IEC 61178-2-1:1993
Edition 1995-02

A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 2: Sectional specification, capability approval; identical with IEC 61178-2:1993
Edition 1995-02