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DIN EN 60747-16-10
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
Edition
2005-03
OEVE/OENORM EN 60747-16-10
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004)
Edition
2005-04-01
SN EN 60747-16-10
Semiconductor devices. Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Edition
2004-09
NF C96-016-10 ; NF EN 60747-16-10:2005-04-01
Semiconductor devices - Part 16-10 : Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Edition
2005-04-01
23/30481778 DC
BS EN IEC 60512-99-002 AMD 1. Connectors for electrical and electronic equipment. Tests and measurements. Part 99-002. Endurance test schedules. Test 99b: Test schedule for unmating under electrical load
Edition
2023-10-31
BS ISO 18523-1
Energy performance of buildings. Schedule and condition of building, zone and space usage for energy calculation. Non-residential buildings
Edition
2017-02-28
BS ISO 18523-2
Energy performance of buildings. Schedule and condition of building, zone and space usage for energy calculation. Residential buildings
Edition
2018-03-29
BS EN 60747-16-10
Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Edition
2004-11-09
UNE-CR 13456
Soil improvers and growing media. Labelling, specifications and product schedules.
Edition
2003-04-30
UNE-EN IEC 60512-99-002
Connectors for electrical and electronic equipment - Tests and measurements - Part 99-002: Endurance test schedules - Test 99b: Test schedule for unmating under electrical load (Endorsed by Asociación Española de Normalización in April of 2022.)
Edition
2022-04-01
