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Technical rule [CURRENT]

DIN SPEC 52407
Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Title (German)

Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM)

Procedure

Technical Report

Document: references other documents

Responsible national committee

NA 062-08-17-02 UA - Test methods  

Edition 2015-03
Original language German
Price from 68.10 €
Order from DIN Media
Table of contents

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