2. Getting involved
  3. Standards Committees
  4. NMP
NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Standards [Withdrawn]

ISO 16700
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Title (German)

Mikrosondenanalyse - Rasterelektronenmikroskopie - Anleitung für die Kalibrierung der Bildvergrößerung

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 4 - Scanning electron microscopy  

Edition 2004-03
Original language English
Price from 70.10 €
Order from DIN Media
Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Send message to contact