NA 062

DIN Standards Committee Materials Testing

Standards [CURRENT]

DIN 51003
Total reflection X-ray fluorescence - Principles and definitions

Title (German)

Totalreflektions-Röntgenfluoreszenz-Analyse (TXRF) - Allgemeine Grundlagen und Begriffe

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Edition 2022-05
Original language German
Price from 117.70 €
Table of contents

Contact

Steffen Jenkel

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10787 Berlin

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