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NA 062

DIN Standards Committee Materials Testing

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Standards [CURRENT]

ISO 16700
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Title (German)

Mikrobereichsanalyse - Rasterelektronenmikroskopie - Leiffäden für die Kalibrierung der Bildvergrößerung

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 4 - Scanning electron microscopy  

Edition 2016-08
Original language English
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Table of contents

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