DIN Standards Committee Materials Testing
DIN 51179
Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects on profiled surfaces - Slurry test
Emails und Emaillierungen - Niederspannungsprüfung zum Nachweis und zur Lokalisierung von Fehlstellen auf profilierten Oberflächen - Schlickermethode
Overview
This document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base. The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces. This standard has been prepared by Working Committee NA 062-01-63 AA "Prüfung von Emails und Emaillierungen" ("Testing of vitreous and porcelain enamels") at DIN Standards Committee Materials Testing (NMP).