NA 062
DIN Standards Committee Materials Testing
Standards
[Withdrawn]
DIN 50451-3
DIN 50451-3
Testing of materials for semiconductor technology - Determination of traces of metals in liquids - Part 3: Al, Co, Cu, Na, Ni and Zn in nitric acid with ICP-MS
Title (German)
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Metallspuren in Flüssigkeiten - Teil 3: Aluminium (Al), Kobalt (Co), Kupfer (Cu), Natrium (Na), Nickel (Ni), Zink (Zn) in Salpetersäure mittels ICP-MS
Document: references other documents
Responsible national committee
NA 062-02-21 AA - Testing of process materials for semiconductor technology