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NA 062

DIN Standards Committee Materials Testing

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Standards [CURRENT]

ASTM E 766
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Title (German)

Eichung der Vergrößerung von REM (Rasterelektronenmikroskopen) unter Verwendung der Eichprobe NBS-SRM-484

Edition 2014
Original language English
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