NA 062

DIN Standards Committee Materials Testing

Standards [Withdrawn]

ISO 17862
Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-of-flight mass analysers

Title (German)

Chemische Oberflächeneanalyse - Sekundärionenmassenspektrometrie - Linearität der Intensitätsskale in einzelne Ionen zählenden Flugzeit-Massenanalysegeräten

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 6/WG 4 - Organic and Nano SIMS  

Edition 2013-12
Original language English
Price from 142.50 €
Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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