2. Getting involved
  3. Standards Committees
  4. NMP
NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Pre-standard

ISO/TS 24597
Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

Title (German)

Mikrobereichsanalyse - Rasterelektronenmikroskopie - Verfahren zur Ermittlung der Bildschärfe

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 4 - Scanning electron microscopy  

Edition 2011-06
Original language English
Price from 239.00 €
Order from DIN Media
Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Send message to contact