2. Getting involved
  3. Standards Committees
  4. NMP
NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Standards [CURRENT]

ISO 14237
Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Title (German)

Chemische Oberflächenanalyse - Sekundärionenmassenspektrometrie - Bestimmung der Atomkonzentration von Bor in Silizium unter Verwendung gleichmäßig dotierter Materialien

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 6 - Mass spectrometries  

Edition 2010-07
Original language English
Price from 142.50 €
Order from DIN Media
Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Send message to contact