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NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [Withdrawn]

ISO 22493
Microbeam analysis - Scanning electron microscopy - Vocabulary

Title (German)

Mikrobereichsanalyse - Rasterelektronenmikroskopie - Vokabular

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis

Responsible international committee

ISO/TC 202/SC 1 - Terminology

Edition 2008-10

Original language English

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Table of contents

PDF (EN)

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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Terminology

DIN Standards Committee Materials Testing

ISO 22493 Microbeam analysis - Scanning electron microscopy - Vocabulary

Responsible national committee

Responsible international committee

Steffen Jenkel

ISO 22493
Microbeam analysis - Scanning electron microscopy - Vocabulary