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NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Project

Microbeam analysis - Analytical electron microscopy - Procedures for determining the point resolution of high-resolution transmission electron microscope

Begin

2024-11-15

Planned document number

ISO/AWI 25387

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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DIN SPEC

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