NA 062
DIN Standards Committee Materials Testing
Project
Surface chemical analysis - Rule sets for automatic retrieval of information from the X-Ray photoelectron spectroscopy survey spectrum - Identification and use of significant minor features in the XPS survey spectrum.
Begin
2024-01-09
Planned document number
ISO/AWI 24689
Responsible national committee
NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy
