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NA 062

DIN Standards Committee Materials Testing

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Project

Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

Begin

2023-09-12

Planned document number

ISO/FDIS 25498

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy  

draft standard

Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
2024-06
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previous edition(s)

Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
2018-03

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Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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