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NA 062

DIN Standards Committee Materials Testing

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Project

Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials

Begin

2023-08-28

Planned document number

ISO/FDIS 20263

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Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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Terminology

DIN Standards Committee Materials Testing

Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials

Begin

Planned document number

Responsible national committee

Responsible international committee

draft standard

previous edition(s)

Steffen Jenkel