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NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Project

Microbeam Analysis - Electron Backscatter Diffraction - Vocabulary

Begin

2024-02-19

Planned document number

ISO/CD 23699

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis

Responsible international committee

ISO/TC 202/SC 1 - Terminology

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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Economic benefits

DIN SPEC

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Terminology