DIN Standards Committee Materials Testing
Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2024)
Abstract
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Begin
2024-07-18
Planned document number
DIN ISO 24173
Project number
06236556
Responsible national committee
NA 062-08-18 AA - Electron microscopy and microbeam analysis
Responsible international committee
ISO/TC 202 - Microbeam analysis