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NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Project

Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

Begin

2022-07-18

Planned document number

ISO/DIS 17297

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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Economic benefits

DIN SPEC

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Get involved in standardization

Terminology

DIN Standards Committee Materials Testing

Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

Begin

Planned document number

Responsible national committee

Responsible international committee

draft standard

Steffen Jenkel