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NA 062

DIN Standards Committee Materials Testing

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Project

Microbeam analysis - Analytical electron microscopy - Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing

Begin

2024-03-27

Planned document number

ISO/WD 16887

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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