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NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Project

Total reflection X-ray fluorescence - Principles and general requirements

Begin

2022-06-08

Planned document number

ISO/CD 16666

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy

Responsible international committee

ISO/TC 201/SC 10/WG 1 - XRF technique

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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Economic benefits

DIN SPEC

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