NA 062

DIN Standards Committee Materials Testing

Project

Microbeam analysis - Analytical electron microscopy - The measurement of the dislocation density in thin metals

Begin

2024-08-22

Planned document number

ISO/AWI 13139

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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