NA 062

DIN Standards Committee Materials Testing

Project

Guideline to describe AFM probe properties

Begin

2021-11-15

Planned document number

ISO/AWI TR 13096

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 9/WG 5 - Calibration of probes  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Send message to contact