DIN Standards Committee Materials Testing
NA 062-08-16 AA
Surface chemical analysis and scanning probe microscopy
NA 062-08-16 AA „Surface Chemical Analysis and Scanning Probe Microscopy“ develops standards and the respective terminology for procedures in surface chemical analysis and scanning probe microscopy. This committee is solely responsible for the development of national standards inside its scope and acts as national mirror committee of ISO/TC 201 “Surface Chemical Analysis“ and its sub-committees.
In this role it is committed to standardization of analytical procedures, in which electrons, ions, neutral atoms, molecules or photons impinge onto the surface of a sample material and the scattered or emitted electrons, ions, neutral atoms, molecules or photons are detected. The procedures inside the scope of NA 062-08-16 AA use the detected signals to perform chemical analyses of surface regions. Their maximum depths are determined by the information depths of the applied methods. Procedures to retrieve chemical compositions as a function of depths also fall into the committee’s scope in case the same surface sensitive methods are applied while subsequently surface layers are removed.
The methods inside the scope of NA 062-08-16 AA originate from the fields of X-ray fluorescence, X-ray absorption, X-ray emission, X-ray reflectometry, X-ray scattering and X-ray diffraction, optical spectroscopy, electron spectroscopy, electron microscopy and electron diffraction, ion spectroscopy, and ion diffraction, as well as scanning probe microscopy and scanning probe spectroscopy.
Inside the analytical procedures the spectroscopic, microscopic and spectro-microscopic methods are applied in pressure regimes ranging from ultra high vacuum (UHV) via atmospheric pressures up to high overpressure conditions to surface of solids, liquids and gaseous phases and their respective interfaces. The analyzed samples cover all materials classes, including classic materials, advanced materials, biological materials and nano-materials, as well as partly or completely processed demonstrators or devices.
