NA 062
DIN Standards Committee Materials Testing
ISO/TC 201/SC 10
X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis
Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, and data analysis in the use of X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis for surface chemical and structural analysis.
National mirror committee of ISO/TC 201/SC 10
Committee ID | Name |
---|---|
NA 062-08-16 AA | Surface chemical analysis and scanning probe microscopy |