NA 062

DIN Standards Committee Materials Testing

ISO/TC 201/SC 10
X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis

Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, and data analysis in the use of X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis for surface chemical and structural analysis.

National mirror committee of ISO/TC 201/SC 10

Committee ID Name
NA 062-08-16 AA Surface chemical analysis and scanning probe microscopy