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NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Draft standard

ISO/DIS 25498
Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

Title (German)

Mikrobereichsanalyse - Analytische Elektronenmikroskopie - Bereichsselektive Elektronenbeugungsanalyse mit einem Transmissionselektronenmikroskop

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy

Edition 2024-06

Original language English

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Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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Economic benefits

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Terminology

DIN Standards Committee Materials Testing

ISO/DIS 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

Responsible national committee

Responsible international committee

Steffen Jenkel

ISO/DIS 25498
Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope