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NA 009

DIN Standards Committee Information and Documentation

About NID Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

ISO 6342
Micrographics - Aperture cards - Method of measuring thickness of buildup area

Title (German)

Mikrographie - Mikrofilmkarte - Verfahren zur Messung der Dicke im Bereich des Kleberahmens

Responsible national committee

NA 009-00-14 AA - Preservation for archives and libraries

Responsible international committee

ISO/TC 171 - Document management applications

Edition 2003-07

Original language English

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Table of contents

Contact

Gregor Roschkowski

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10787 Berlin

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Fax: +49 30 2601-42875

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Terminology

DIN Standards Committee Information and Documentation

ISO 6342 Micrographics - Aperture cards - Method of measuring thickness of buildup area

Responsible national committee

Responsible international committee

Gregor Roschkowski

ISO 6342
Micrographics - Aperture cards - Method of measuring thickness of buildup area