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NA 043

DIN Standards Committee Information Technology and IT Applications

About NIA Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Project

Face image profile for less constrained capture conditions

Begin

2024-11-25

Planned document number

ISO/IEC AWI 25447

Responsible national committee

NA 043-04-37 AA - Biometrics

Responsible international committee

ISO/IEC JTC 1/SC 37/WG 3 - Biometric data interchange formats

Contact

Ulrike De Grande

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2320
Fax: +49 30 2601-42320

Send message to contact

Economic benefits

DIN SPEC

Why do standards cost money?

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Terminology