DIN Standards Committee Radiology
DIN EN 61000-4-8
; VDE 0847-4-8:2010-11
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test (IEC 61000-4-8:2009); German version EN 61000-4-8:2010
Elektromagnetische Verträglichkeit (EMV) - Teil 4-8: Prüf- und Messverfahren - Prüfung der Störfestigkeit gegen Magnetfelder mit energietechnischen Frequenzen (IEC 61000-4-8:2009); Deutsche Fassung EN 61000-4-8:2010
Overview
This standard contains the German version of the 2. edition of the European Standard EN 61000-4-8 (edition 2010-02) and is identical to the 2. edition of the International Standard IEC 61000-4-8 (edition 2009-09). It describes the immunity test of electrical and electronic equipment against power frequency magnetic fields. Hereto the required definitions, the recommended test levels the test equipment, the test set-up and the test procedure are described and specifications concerning the test report and the evaluation of the test results are given. In relation to the previous edition of the standard the definition current distortion factor was introduced, clarifications to the use of the ground plane only for tests of table-top equipment were done, specifications concerning the calibration if the used induction coils were added (division between standardized and other induction coils) and a note concerning the safety of human persons in relation to electromagnetic fields was added. The responsible Committees are Subcommittees UK 767.1 "Niederfrequente leitungsgeführte Stromgrößen" ("Low-frequency conducted disturbances"), UK 767.3 "Hochfrequente Störgrößen" ("High-frequency disturbances") and UK 767.6 "Schutz von Einrichtungen der Informationstechnik gegen Überspannungen und niederfrequente Felder" ("Protection of information technology equipment against overvoltages and low-frequency fields") under K 767 "Elektromagnetische Verträglichkeit (EMV)" ("Electromagnetic compatibility (EMC)") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
