NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61000-4-1 ; VDE 0847-4-1:2007-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60050-161 | 1990-08 | International elektrotechnical vocabulary; chapter 161: electromagnetic compatibility More |
| IEC 61000-4-13 | 2002-03 | Electromagnetic compatibility (EMC) - Part 4-13: Testing and measurement techniques; Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests More |
| IEC 61000-4-14 | 1999-02 | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test More |
| IEC 61000-4-17 | 1999-06 | Electromagnetic compatibility (EMC) - Part 4-17: Testing and measuring techniques - Ripple on d.c. input power port, immunity test More |
| IEC 61000-4-25 | 2001-11 | Electromagnetic compatibility (EMC) - Part 4-25: Testing and measurement techniques; HEMP immunity test methods for equipment and systems More |
| IEC 61000-4-27 | 2000-08 | Electromagnetic compatibility (EMC) - Part 4-27: Testing and measurement techniques; Unbalance, immunity test for equipment with input current not exceeding 16 A per phase More |
| IEC 61000-4-28 | 1999-11 | Electromagnetic compatibility (EMC) - Part 4-28: Testing and measurement techniques - Variation of power frequency, immunity test for equipment with input current not exceeding 16 A per phase More |
| IEC 61000-4-29 | 2000-08 | Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques; Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests More |
| IEC 61000-4-32 | 2002-10 | Electromagnetic compatibility (EMC) - Part 4-32: Testing and measurement techniques; High-altitude electromagnetic impulse HEMP simulator compendium More |
| IEC 61000-4-33 | 2005-09 | Electromagnetic compatibility (EMC) - Part 4-33: Testing and measurement techniques - Measurement methods for high-power transient parameters More |
