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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Pre-standard [Withdrawn]

DIN V VDE V 0126-18-4-2 ; VDE V 0126-18-4-2:2007-06
Solar wafers - Part 4-2: Process for measuring the electrical characteristics of silicon - Minority carrier lifetime, Laboratory measuring method

Title (German)

Solarscheiben - Teil 4-2: Verfahren zur Messung der elektrischen Eigenschaften von Siliciumscheiben - Minoritätsladungsträgerlebensdauer, Labor-Messmethode

Procedure

Responsible national committee

DKE/K 373 - Photovoltaische Solarenergie-Systeme

Edition 2007-06

Original language German

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Table of contents

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN V VDE V 0126-18-4-2 ; VDE V 0126-18-4-2:2007-06 Solar wafers - Part 4-2: Process for measuring the electrical characteristics of silicon - Minority carrier lifetime, Laboratory measuring method

Procedure

Responsible national committee

Dominika Radacki

DIN V VDE V 0126-18-4-2 ; VDE V 0126-18-4-2:2007-06
Solar wafers - Part 4-2: Process for measuring the electrical characteristics of silicon - Minority carrier lifetime, Laboratory measuring method