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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Pre-standard [Withdrawn]

DIN V VDE V 0126-18-2-1 ; VDE V 0126-18-2-1:2007-06
Solar wafers - Part 2-1: Measuring the geometric dimensions of silicon wafers - Wafer thickness

Title (German)

Solarscheiben - Teil 2-1: Messung der geometrischen Dimension von Siliciumscheiben - Scheibendicke

Procedure

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 373 - Photovoltaische Solarenergie-Systeme

Edition 2007-06

Original language German

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Table of contents

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