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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [Withdrawn]

DIN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006); German version EN 60749-27:2006

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM) (IEC 60749-27:2006); Deutsche Fassung EN 60749-27:2006

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Responsible international committee

IEC/TC 47 - Semiconductor devices

Edition 2007-01

Original language German

Price from 77.90 €

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Table of contents

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