NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62132-1 [Withdrawn] referenced in following documents:
| Document number | Edition | Title |
|---|---|---|
| DIN EN 62132-2 ; VDE 0847-22-2:2011-07 | 2011-07 | Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011 More |
| DIN EN 62132-8 ; VDE 0847-22-8:2013-03 | 2013-03 | Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012 More |
| DIN IEC/TS 62132-9 ; VDE V 0847-22-9:2015-08 | 2015-08 | Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014) More |
