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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

IEC 60512-25-6
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Title (German)

Prüfverfahren - Teil 25-6: Prüfung 25f - Augendiagramm und Jitter

Edition 2004-05

Original language English , French

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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

IEC 60512-25-6 Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

IEC 60512-25-6
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter