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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

EN 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: Beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung (IEC 60749-33:2004)

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2004-04
Original language English
Price On Request
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Table of contents

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Elena Rongen

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