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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: Beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigende Wirkung (HAST) ohne elektrische Beanspruchung (IEC 60749-24:2004)

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 2004-04

Original language English

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Table of contents

Contact

Elena Rongen

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

EN 60749-24 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)

Responsible national committee

Elena Rongen

EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)