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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60444-8 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60444-1 | 1997-04 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network (IEC 60444-1:1986) More |
| EN 60444-2 | 1997-04 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980) More |
| EN 60444-5 | 1997-04 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction (IEC 60444-5:1995) More |
| EN 61240 | 1997-04 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:1994) More |
| IEC 60444-1 | 1986 | Measurement of quartz crystal unit parameters by zero phase technique in a π-network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network More |
| IEC 60444-2 | 1980 | Measurement of quartz crystal unit parameters by zero phase technique in a π-network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units More |
| IEC 60444-4 | 1988 | Measurement of quartz crystal unit parameters by zero phase technique in a π-network; part 4: method for the measurement of the load resonance frequency FL load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz More |
| IEC 60444-5 | 1995-03 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction More |
