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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

EN 60749-25
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 25: Zyklische Temperaturwechsel (IEC 60749-25:2003)

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2003-09
Original language English
Price On Request
Order from DIN Media
Table of contents

Contact

Elena Rongen

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63069 Offenbach am Main

Tel.: +49 69 6308-429

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