NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-20 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60749-3 | 2002-08 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2002) More |
