NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60747-16-1 | 2002-02 | Semiconductor devices - Part 16-1: Microwave integrated circuits; Amplifiers (IEC 60747-16-1:2001) More |
| EN 60747-16-3 | 2002-07 | Semiconductor devices - Part 16-3: Microwave integrated circuits; Frequency converters (IEC 60747-16-3:2002) More |
| EN 60747-5-1 | 2001-07 | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General (IEC 60747-5-1:1997) More |
| EN 60747-5-1/A1 | 2002-02 | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment A1 (IEC 60747-5-1:1997/A1:2001) More |
| EN 60747-5-1/A2 | 2002-05 | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment A2 (IEC 60747-5-1:1997/A2:2002) More |
| EN 60747-5-2 | 2001-07 | Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics (IEC 60747-5-2:1997) More |
| EN 60747-5-2/A1 | 2002-05 | Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices; Essential ratings and characteristics; Amendment A1 (IEC 60747-5-2:1997/A1:2002) More |
| EN 60747-5-3 | 2001-07 | Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods (IEC 60747-5-3:1997) More |
| EN 60747-5-3/A1 | 2002-05 | Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices; Measuring methods; Amendment A1 (IEC 60747-5-3:1997/A1:2002) More |
| IEC 60050-111 | 1996-07 | International Electrotechnical Vocabulary - Chapter 111: Physics and chemistry More |
