NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

Standards [CURRENT]

DIN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 1: Allgemeines (IEC 60749-1:2002 + Corr. 1:2003); Deutsche Fassung EN 60749-1:2003

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Responsible international committee

IEC/TC 47 - Semiconductor devices  

Edition 2003-12
Original language German
Price from 56.60 €
Table of contents

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